Test Generation for CEFSM Combining Specification and Fault Coverage
نویسندگان
چکیده
We discuss how specification coverage and fault coverage based test derivation strategies can be combined. In particular, the problem of deriving a test suffix, which raises tester confidence in the configuration of the system, reached after a test derived by a specification coverage criterion, is formalized and solved in the CEFSM setting. The traditional mutant-based test derivation approach is extended with nondeterministic mutants to cover more faults. An experimental tool and case study are reported.
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